MatMeas DMS1650 Ultra-High Temperature Dielectric Impedance Spectrometer | Dielectric Property Analyzer up to 800°C — 1

Overview

MatMeas DMS1650 Ultra-High Temperature Dielectric Impedance Spectrometer is an integrated system specifically developed for studying the electrical properties of dielectric materials under ultra-high temperature conditions.

The instrument combines a high-temperature furnace, precision measurement fixture, advanced control software, and an integrated display system into a compact platform. Based on the parallel-plate capacitor measurement principle, the system enables accurate characterization of dielectric constant, dielectric loss, and impedance spectroscopy over a wide temperature and frequency range.

The system supports testing under ambient atmosphere, high-temperature conditions, vacuum environments, and controlled gas atmospheres, allowing researchers to investigate the dielectric behavior of materials as a function of temperature, frequency, and time.

With its stable temperature control system and integrated design, the DMS1650 provides reliable and repeatable dielectric measurements for ceramic materials, electronic components, and advanced functional materials. It is widely used in universities, research institutes, and industrial laboratories for dielectric material research and development.

Specifications

Parameter Specification
Temperature Range Room Temperature ~  1600°C
Temperature Control Accuracy ±3°C
Temperature Control Method PID Precision Control
Heating Rate 0–10°C/min (Typical 3°C/min)
Frequency Range ~20 Hz – 1 MHz
Measurement Accuracy Dependent on the specifications of the connected impedance analyzer.
Measurement Principle Parallel Plate Capacitor Method
Measurement Channel Single Channel
Sample Size Diameter < 20 mm, Thickness < 5 mm
Electrode Material Platinum Electrodes (Top and Bottom)
Measurement Environment Flowing Gas Atmosphere
Operating Temperature 5 °C – 40 °C
Power Supply 220 V / 60 Hz ~ 4800 W
Dimensions 1260 x 760 x 1727mm(LxWxH)
Weight 200kgs
Warranty 1 Year

Applications

  1. Dielectric
    Ceramic Materials Characterization of dielectric properties of ferroelectric ceramics, piezoelectric ceramics, and microwave dielectric materials.
  2. Electronic
    Component Materials Evaluation of dielectric performance in capacitors, insulating materials, and electronic substrates.
  3. Functional
    Oxide Materials Study of dielectric response of perovskite materials and advanced oxide ceramics at elevated temperatures.
  4. Energy Storage
    Materials Investigation of dielectric behavior in high-temperature energy storage ceramics and dielectric capacitor materials.
  5. Academic Research
    Widely used in universities and research institutes for advanced dielectric materials research.

FAQ

  • What is the primary measurement principle of M?

    M is designed using advanced electrical characterization methods to measure dielectric impedance spectrometer with extreme precision, eliminating lead resistance and temperature fluctuations.

  • What sample shapes and forms are supported?

    The system supports standard sample geometries including solid blocks, circular thin-sheet discs, and rectangular bars with specialized test fixtures.

  • Does M comply with international laboratory standards?

    Yes, all measurements fully align with international norms such as ASTM, IEEE, and GB/T standards to deliver publishable, research-grade data.

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