RTS-1000S High-Temp Semiconductor Resistivity System — 1

Overview

RMS-1000S High-Temp Semiconductor Material Resistivity Measurement System provides comprehensive solutions for bulk semiconductor characterization. As a dedicated semiconductor test system supplier, we offer precise two-wire measurement for silicon, germanium, GaAs, InSb, and compound semiconductors. The patented spring-loaded electrode fixture with heat dissipation design ensures stable contact and accurate temperature control from RT-1000°C, serving universities, research institutes, and semiconductor manufacturers worldwide.

Specifications

Parameter Value
Measurement Principle Four-wire resistivity measurement method
Main Measurement Resistance & resistivity vs temperature/time
Max Furnace Temperature Up to 1100°C
Temperature Control Accuracy ±0.5°C
Atmosphere Inert/oxidizing/reducing; vacuum
Notable Features Spring + self-weight contact; beginner-friendly software; fault diagnosis
Temperature Range RT-600°C / 1000°C
Temperature Control Method PID precision control (multi-stage)
Heating Rate 0-10°C/min (typical 3°C/min)
Resistance Range 0.1mΩ ~ 100MΩ
Resistivity Range 1mΩ.cm ~ 10MΩ.cm
Sample Specification Ø<20mm, d<5mm
Measurement Method Two-wire method for semiconductors
Electrode Material Platinum (upper/lower)
Patent No. 2019204156568
Display 10.1" color touchscreen
Data Interface USB
Data Storage TXT format
Dimensions (L×H×W) 630×640×450mm
Weight 42.5kg
Power Supply 220V±10%, 50Hz, 2.6kW
Working Environment 5°C to +40°C
Standards ASTM standards

Applications

  1. RMS-1000S is designed for bulk semiconductor materials including silicon (Si), germanium (Ge), gallium arsenide (GaAs), indium antimonide (InSb), ternary compounds (GaAsAl, GaAsP), and solid solution semiconductors (Ge-Si, GaAs-GaP). Essential for PTC/NTC thermistor development, power semiconductor research, and temperature sensor manufacturing.

More Details

Stable High-Temperature Measurement
Spring + self-weight contact design reduces contact issues and data jumps.
Control & Diagnostics
Multi-stage PID control and fault diagnosis indicators help keep temperature and contacts stable.

FAQ

  • What is the primary measurement principle of RTS-1000S?

    RTS-1000S is designed using advanced electrical characterization methods to measure semiconductor resistivity measurement with extreme precision, eliminating lead resistance and temperature fluctuations.

  • What sample shapes and forms are supported?

    The system supports standard sample geometries including solid blocks, circular thin-sheet discs, and rectangular bars with specialized test fixtures.

  • Does RTS-1000S comply with international laboratory standards?

    Yes, all measurements fully align with international norms such as ASTM, IEEE, and GB/T standards to deliver publishable, research-grade data.

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