FMS Ferroelectric Measurement Spectrometer - MatMeas — 1

Overview

The FMS series ferroelectric measurement spectrometer is designed to analyze electrical properties of ferroelectric materials. The system supports hysteresis loop testing, fatigue measurement, leakage current analysis, polarization and depolarization studies. With integrated high‑voltage amplifiers and precise PID temperature control, the instrument enables stable testing in high and low temperature environments. It is widely used in universities, research institutes and industrial laboratories for advanced ferroelectric material characterization.

Specifications

Parameter Value
Measurement Channel Single channel
Temperature Range −160°C to 450°C
Temperature Accuracy ±0.5°C
Heating Rate 0–10°C/min
Heating Method Resistive heating
Test Voltage ±100V / ±10kV
Current Measurement Range 500 fA – 1 A
Maximum Load Capacitance 1 µF
Hysteresis Frequency 1 mHz – 1 kHz
Sample Type Bulk or thin film
Sample Size φ < 20 mm; thickness < 5 mm
Power Supply 220V, 50–60 Hz
Weight 32 kg
Warranty 1 year

Applications

  1. Ferroelectric material research
  2. Thin film and bulk ferroelectric characterization
  3. Leakage current analysis
  4. Fatigue reliability testing
  5. Polarization and depolarization studies

Suggested sections

  • Accurate Hysteresis Loop Measurement
  • Fatigue Testing of Ferroelectric Materials
  • Leakage Current Analysis
  • PID Temperature Control System
  • High‑Voltage Amplifier Protection Design

FAQ

  • What is the primary measurement principle of FMS?

    FMS is designed using advanced electrical characterization methods to measure piezoelectric analyzer with extreme precision, eliminating lead resistance and temperature fluctuations.

  • What sample shapes and forms are supported?

    The system supports standard sample geometries including solid blocks, circular thin-sheet discs, and rectangular bars with specialized test fixtures.

  • Does FMS comply with international laboratory standards?

    Yes, all measurements fully align with international norms such as ASTM, IEEE, and GB/T standards to deliver publishable, research-grade data.

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