MatMeas High Precision In‑situ d33 Piezoelectric Measurement System – PEMS Analyzer — 1

Overview

The MatMeas PEMS precision in‑situ d33 measurement system is designed for advanced characterization of piezoelectric materials. The system integrates dynamic direct traceability technology and AC resonance vibration evaluation to measure piezoelectric parameters with higher accuracy and reliability than traditional quasi‑static d33 meters. It supports measurement of multiple sample shapes such as discs, rings, tubes, blocks and strips, making it suitable for research institutes, material laboratories and industrial piezoelectric component production.

Specifications

Force Frequency 30 Hz – 300 Hz
Default Frequency 110 Hz
Frequency Accuracy 0.1 Hz
FAST Mode 2 s to 1% of final reading
MEDIUM Mode 5 s to 1% of final reading
SLOW Mode 10 s to 1% of final reading
Communication Interface RS232, USB
Power Supply 220–240V AC 50–60Hz 0.5A
Alternative Power 100–120V AC 50–60Hz 1A
Storage Temperature 0°C – 50°C
Operating Temperature 10°C – 40°C
Calibration Temperature 25°C
Instrument Size 600 × 540 × 1530 mm
Measurement Unit Size 350 × 250 × 100 mm
Force Unit Size 145 × 150 × 175 mm

Applications

  1. Piezoelectric ceramic research
  2. sensor and actuator development
  3. aerospace and defense materials testing
  4. semiconductor laboratories
  5. advanced materials research institutes
  6. industrial quality inspection of piezoelectric components.

More Details

  1. PEMS Piezoelectric Analyzer Features
    Supports measurement of d33, d31 and d15 coefficients. Measures equivalent circuit parameters including C1, L1, R1 and C0 and resonance frequencies fs, fp, fm, fn, fa and fr. Dynamic force measurement enables analysis of d33 variation under different preload conditions
  2. PEMS Piezoelectric Analyzer Specifications
    measurement frequency 30–300 Hz, default 110 Hz, communication interfaces RS232 and USB, measurement accuracy high precision with repeatable results for laboratory and industrial environments.

FAQ

  • What is the primary measurement principle of M?

    M is designed using advanced electrical characterization methods to measure piezoelectric analyzer with extreme precision, eliminating lead resistance and temperature fluctuations.

  • What sample shapes and forms are supported?

    The system supports standard sample geometries including solid blocks, circular thin-sheet discs, and rectangular bars with specialized test fixtures.

  • Does M comply with international laboratory standards?

    Yes, all measurements fully align with international norms such as ASTM, IEEE, and GB/T standards to deliver publishable, research-grade data.

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