Matmeas PEAI1000 High-Precision Piezoelectric Analyzer — 1

Overview

The Matmeas PEAI1000 piezoelectric analyzer is designed for precise measurement of piezoelectric coefficients including d33 and d31 using advanced dynamic measurement technology. The system integrates lock‑in amplifier signal processing to suppress noise and ensure highly stable measurement results. It is widely used in piezoelectric ceramic research, sensor development, materials science laboratories and industrial quality inspection of piezoelectric components.

Specifications

Measurement Method Dynamic method with Lock-in amplification
Measurement Range (d33) 0 ~ 2000 pC/N
Calibration Frequency 110 Hz
Static Clamping Force 1 ~ 10 N (Adjustable)
Dynamic Test Force 0.1 ~ 0.5 N (Adjustable)
Measurement Accuracy ±2%
Compatible Sample Types Blocks, Plates, and Thin Films
Max Sample Dimensions Φ ≤ 40 mm, d ≤ 20 mm
Calibration Factory calibrated, includes a dedicated piezoelectric calibration sample box

Applications

  1. Piezoelectric material research
  2. Piezoelectric ceramic manufacturing
  3. Sensor and actuator development
  4. Aerospace materials testing
  5. Semiconductor and electronic component laboratories

More Details

  1. PEAI1000 Piezoelectric Analyzer Features
    Dynamic measurement method ensures high accuracy. Lock-in amplifier technology improves signal detection and reduces environmental noise. Integrated mechanical fixture applies consistent dynamic force from 0.05N to 0.5N for reliable measurements.
  2. PEAI1000 Piezoelectric Analyzer Specifications
    Measurement range 0–2000 pC/N, frequency 110 Hz, measurement accuracy ±2%, sample size Φ < 40 mm thickness < 20 mm, power supply 220V 50–60Hz.

FAQ

  • How does the PEAI1000 eliminate environmental noise during low-signal d33 measurements?

    Traditional d33 meters often struggle with background interference. The PEAI1000 overcomes this by adopting state-of-the-art lock-in amplification technology. This dramatically suppresses useless background noise and drastically improves the detection signal-to-noise ratio, ensuring highly reliable data even for materials with weak piezoelectric responses.

  • Can the system safely control the applied forces on delicate samples like thin films?

    Yes. Unlike basic d33 meters that use fixed, heavy mechanical weights, the PEAI1000 allows researchers to precisely apply variable static clamping forces (1 N to 10 N) and dynamic test forces (0.1 N to 0.5 N). This ensures optimal electrical contact while protecting delicate samples from physical crushing, yielding higher measurement accuracy.

  • What is the measurement range and what sample sizes are supported?

    The instrument offers an ultra-wide d33 measurement range from 0 to 2000 pC/N with a certified accuracy of ±2%. The spacious test fixture accommodates a variety of sample formats including bulk blocks, plates, and films, supporting maximum dimensions of up to 40 mm in diameter (Φ) and 20 mm in thickness (d).

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