High-Temperature Dielectric & Impedance Spectroscopy (RT to 1650°C)
Broadband impedance, Nyquist, and Cole-Cole plots up to 1650°C (HTS-1000 / DMS-1650).
Testing Services
CMA Accredited Testing Lab (No. 261721340056)
⏱ Standard Turnaround: 3–5 Working Days (Raw .txt + Certified Report)Comprehensive Electrical Characterization Capabilities
Dielectric & Impedance (-160°C to 1650°C)
In-Situ & Quasi-Static d33 / d31 / d15
Ferroelectric P-E Loop & PUND (±10 kV)
IEEE 5-Mode Resonance (20 Hz–120 MHz)
TSDC & Pyroelectric Depolarization
Insulation Resistivity & 50 kV Breakdown
High-Temp Four-Probe & Kelvin Bridge
Energy Harvesting Voc / Isc & PFM
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MatMeas Testing Services operates an accredited third-party electrical characterization platform (CMA Certificate No. 261721340056, CNAS accreditation in progress) dedicated to serving as a trusted technical partner for advanced functional materials research and industrial device manufacturing.
Staffed by an elite engineering team with 100% Master’s and Ph.D. qualifications, we provide high-precision measurements, quantitative physical property analysis, and deep technical consulting. Built upon our core values of Scientific Rigor, Impartiality, and Accuracy, our laboratory bridges basic materials synthesis, component reliability validation, and commercial scale-up.
Core Focus & Material Coverage
Our electrical characterization services deeply cover MLCC, LTCC, Piezoelectrics, Pyroelectrics, PTC, Sensitive Functional Ceramics, and PVDF Piezoelectric Thin Films, providing comprehensive one-stop technical solutions from intrinsic property evaluation to device-level reliability screening.
CMA Accredited Rigor & Proven Client Trust
Leveraging decades of domain expertise and strict ISO-aligned quality systems, our laboratory has earned the long-term trust of premier academic institutions including Tsinghua University, Shanghai Institute of Ceramics (SICCAS), Huazhong University of Science and Technology (HUST), and Wuhan University of Technology (WUT), alongside global industrial leaders such as Huawei, BYD, Fenghua Advanced Technology, Zhenhua Group, and CSIC 713 Research Institute.
Our Service Commitments
- ✓Faster & More Accurate: Standard turnaround within 3–5 working days
- ✓Full Data Deliverables: Certified report + raw ASCII/txt waveform files for Origin
- ✓Dual-Funnel Validation: Test before you invest in turnkey instruments
- ✓Full-Chain Prep Support: In-house electrode firing, sputtering & high-voltage poling
Testing Process
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Business quotation
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Dielectric & Impedance Spectroscopy
Cryogenic-to-High-Temperature Dielectric Spectroscopy (-160°C to 450°C)
Liquid nitrogen cryo-cooling with automated temperature sweeps (DMS-2000).
Thin-Film Variable-Temperature Dielectric Testing
Micro-manipulated probe station testing on dot-array micro-electrodes in high vacuum (CPS).
Microwave Dielectric Characterization (TE01δ Closed Cavity, 2–19 GHz)
Precision Hakki-Coleman closed cavity for 5G/6G low-loss ceramics and Qf determination.
Piezoelectric & Resonance Characterization
In-Situ High/Low-Temperature Piezoelectric d33 Testing (-50°C to 700°C)
Direct dynamic force in-situ measurement of d33 thermal depoling up to 700°C (PEMS-1000).
Quasi-Static Piezoelectric d33 / d31 / d15 Coefficient Testing
Direct traceability method measuring longitudinal, transverse, and shear constants (PEAL-1000).
Piezoelectric Ceramic Resonance Parameter Analysis (5 Vibration Modes)
Full IEEE 176 parameter extraction across Kp, kt, K33, K31, and K15 modes up to 120 MHz (PCA-1000).
Open-Circuit Voltage (Voc) & Short-Circuit Current (Isc) Testing Series
Dynamic energy-harvesting output under ultrasonic, shaker, and cyclic motor loading (Keysight 6517B).
Piezoresponse Force Microscopy (PFM) Nanoscale Domain & Switching Testing
Nanoscale domain mapping and local ferroelectric switching loops with Oxford Asylum Research VERO ES.
Ferroelectric & Pyroelectric Testing
Ferroelectric P-E Hysteresis Loop & PUND Measurement (±10 kV)
Biphasic high-voltage drive up to ±10 kV with PUND pulse remanent polarization separation (FEMS-1000).
Thermally Stimulated Depolarization Current (TSDC) & Pyroelectric Testing
Measures picoampere depolarization currents across -160°C to 450°C to extract trap depths and Pi.
Resistivity, High-Temperature Conduction & Breakdown
High-Temperature Volume & Surface Resistivity Testing (RT to 1000°C)
Guarded three-ring electrode geometry eliminating surface leakage currents up to 1000°C (HTS-1000).
Cryogenic-to-High-Temperature Insulation Resistance & Leakage Current
Evaluates insulation resistance from -160°C to 450°C under vacuum or dry nitrogen (CPS / HTS-1000).
Ceramic & Polymer Film Dielectric Breakdown & Withstand Voltage Testing
Precision DC breakdown up to 50 kV and AC up to 10 kV in silicone insulating oil (VBT-50KV).
High-Temperature Conductor & Semiconductor Four-Probe Resistivity
Collinear four-probe testing from room temp to 1000°C with delta-mode nanovolt accuracy (6220+2182A).
High-Temperature Thin Film & Coating Sheet Resistance Testing (Up to 1600°C)
Dual-configuration four-probe testing up to 1600°C without geometric correction factors (HTS-1000).
Ultra-High-Temperature Conductor Resistivity Testing (Up to 1600°C)
Kelvin four-terminal bridge for graphite, C/C composites, and molten glass conductivity (RMS-1650C).
Sample Preparation & Poling Services
High-Voltage Oil Bath Piezoelectric Poling Service (Up to 50 kV, 180°C)
High-temperature dielectric oil immersion poling up to 50 kV for bulk ceramics and crystals (OBP-30KV).
Non-Contact Corona Poling Service for Thin Films & Electrets (SPD / FCP)
Gentle needle-grid corona discharge up to ±20 kV for PVDF, cellular electrets, and delicate films (SPD/FCP).
Technical Solutions
Testing Standards Database
Reference standards aligned with dielectric, resistivity, and piezoelectric characterization workflows.
ASTM D150
Parallel plate capacitor method testing
GB/T 31838.6-2021/IEC 62631-2-1:2018
Solid insulating materials dielectric and resistive properties Part 6 dielectric properties AC methods relative permittivity and dissipation factor (0.1 Hz to 10 MHz)
GBT 3389-2008
Test methods for performance parameter testing of piezoelectric ceramic materials
GB 11310-1989
Test methods for temperature characteristic testing of the relative free dielectric constant of piezoelectric ceramic materials
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