High-Temperature Semiconductor Four-Probe Resistivity Testing
Technical Specifications & Test Capabilities
| Parameter / Metric | Specification Range & Accuracy | Operational Notes |
|---|---|---|
| Temperature Range | Room Temperature to 1000°C | Controlled atmosphere heating stage |
| Current Source Range | 1 pA to 1.05 A (Keithley 6220) | Programmable low-noise current excitation |
| Voltage Detection | 1 nV to 105 V (Keithley 2182A) | Nanovolt-resolution delta-mode measurement |
| Testing Methods | Four-Point Collinear Probe & Van der Pauw | Cancels contact resistance and lead impedance |
Specimen Geometry & Preparation Guide
| Material Form | Recommended Dimensions | Dimensional Limits | Electrode & Poling Notes |
|---|---|---|---|
| Rectangular Bar | 15 × 5 × 2 mm | Length ≥ 10 mm, width ≥ 2 mm | Polished parallel surfaces; metals, graphite, SiC, semiconductors |
| Square Wafer Coupon | 10 × 10 mm to 15 × 15 mm, thickness 1–2 mm | Thickness < 3 mm | Corner contacts for Van der Pauw configuration |
Testing Function
Characterizing the resistivity and electrical conductivity (σ) of metals, alloys, semiconductors (SiC, GaN), and thermoelectric compounds up to 1000°C demands ultra-precise I-source and V-sense techniques. Pairing a Keithley 6220 current source with a 2182A nanovoltmeter in delta mode, our laboratory eliminates thermoelectric EMF errors and contact resistance, providing verified R-T, ρ-T, and temperature coefficient of resistance (TCR) curves.
Testing Conditions
Primary Instruments: Keithley 6220 Current Source, Keithley 2182A Nanovoltmeter
Standard Turnaround: Within 5 working days
Key Standards: ASTM F84 Standard Test Method for Measuring Resistivity of Silicon Slices With an In-Line Four-Point Probe; GB/T 1551-2009 Method for Measuring the Resistivity of Monocrystal Silicon
Sample Requirements
Please review the detailed specimen dimensions, electrode requirements, and poling conditions in the table above. Custom dimensions and special sample geometry can be accommodated upon technical consultation.
Testing Standards
- ASTM F84 Standard Test Method for Measuring Resistivity of Silicon Slices With an In-Line Four-Point Probe
- GB/T 1551-2009 Method for Measuring the Resistivity of Monocrystal Silicon
Test Results
Clients receive comprehensive test reports with raw exported ASCII/txt data files, high-resolution curve plots (temperature spectra, impedance plots, or hysteresis loops), and experimental condition parameters stamped by our CMA accredited testing center.
Turnkey Equipment for Your Own Laboratory
Prefer in-house characterization? Every test in our laboratory is performed using MatMeas turnkey instruments. Verify measurement quality with sample testing before capital procurement.
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