Thin-Film Variable-Temperature Dielectric Testing
Technical Specifications & Test Capabilities
| Parameter / Metric | Specification Range & Accuracy | Operational Notes |
|---|---|---|
| Temperature Range | -160°C to 450°C | Cryogenic vacuum chamber with controlled dry N2 purging |
| Frequency Range | 100 Hz to 1 MHz / 5 MHz / 10 MHz / 20 MHz / 30 MHz | Ultra-low stray capacitance probing |
| Electrode Interface | Micro-manipulated tungsten probes & dot-array contact | Electrode diameter down to 200 µm |
Specimen Geometry & Preparation Guide
| Material Form | Recommended Dimensions | Dimensional Limits | Electrode & Poling Notes |
|---|---|---|---|
| Substrate-Supported Films (e.g., PZT/Si) | Top sputtered dot electrodes Ø200–400 µm | Substrate 10×10 mm to 2-inch wafer | Bottom conductive electrode (e.g. Pt) exposed on edge for grounding |
| Free-Standing Polymer Films | Diameter 15–20 mm, thickness 10–50 µm | Thickness 5–100 µm | Opposing sputtered gold electrodes Ø3–5 mm |
Testing Function
Thin-film dielectric devices (such as integrated ferroelectric memories, MEMS actuators, and flexible energy storage films) require specialized high-vacuum probe station testing to prevent surface atmospheric moisture absorption and micro-electrode short-circuiting. Our CPS testing system supports micro-manipulated probing on micro-dot arrays (Ø ≥ 200 µm) from -160°C to 450°C, providing rigorous capacitance, loss tangent, and impedance frequency spectra.
Testing Conditions
Primary Instruments: CPS Cryogenic Vacuum Probe Station Series
Standard Turnaround: Within 5 working days
Key Standards: ASTM D150 Standard Test Methods for AC Loss Characteristics and Permittivity; IEC 60250 Determination of Permittivity and Dielectric Dissipation Factor
Sample Requirements
Please review the detailed specimen dimensions, electrode requirements, and poling conditions in the table above. Custom dimensions and special sample geometry can be accommodated upon technical consultation.
Testing Standards
- ASTM D150 Standard Test Methods for AC Loss Characteristics and Permittivity
- IEC 60250 Determination of Permittivity and Dielectric Dissipation Factor
Test Results
Clients receive comprehensive test reports with raw exported ASCII/txt data files, high-resolution curve plots (temperature spectra, impedance plots, or hysteresis loops), and experimental condition parameters stamped by our CMA accredited testing center.
Turnkey Equipment for Your Own Laboratory
Prefer in-house characterization? Every test in our laboratory is performed using MatMeas turnkey instruments. Verify measurement quality with sample testing before capital procurement.
Request High-Precision Testing Solutions
Get expert guidance and customized instruments for your functional materials project.