What information does dual AC resonance tracking (DART) PFM provide?

DART PFM tracks surface topography, out-of-plane amplitude/phase (vertical PFM), and in-plane amplitude/phase (lateral PFM) simultaneously at the contact resonance frequency, amplifying nanoscale piezoelectric response while eliminating topography cross-talk.

Can PFM measure local polarization switching and write ferroelectric domains?

Yes. By applying DC tip bias pulses (up to ±10 V), we perform local switching spectroscopy (SS-PFM) to plot amplitude-voltage butterfly loops and phase-voltage hysteresis loops, and write patterned domain arrays on thin film surfaces.

What sample surface roughness is required for PFM analysis?

The sample surface must be atomically smooth or polished to an RMS surface roughness ≤ 2 nm. A conductive bottom electrode (such as Pt, SrRuO3, or FTO) is required for electrical grounding.

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Piezoresponse Force Microscopy (PFM) Nanoscale Testing

Apparatus:Oxford Instruments Asylum Research VERO ES

Technical Specifications & Test Capabilities

Parameter / Metric	Specification Range & Accuracy	Operational Notes
AFM Operational Mode	Contact-mode PFM with Dual AC Resonance Tracking (DART)	Ultra-low crosstalk amplitude & phase detection
DC Bias Voltage	±150 V (Programmable tip bias pulses)	Local domain writing and reverse switching
Imaging Capabilities	Amplitude mapping, Phase mapping, Topography	Nanometer to sub-picometer vertical deformation
Spectroscopy Functions	Local d33* butterfly loops and phase-bias hysteresis	Single-point switching spectroscopy

Specimen Geometry & Preparation Guide

Material Form	Recommended Dimensions	Dimensional Limits	Electrode & Poling Notes
Ferroelectric / Piezoelectric Thin Films	Diameter ≤ 10 mm, height ≤ 20 mm	RMS surface roughness < 50 nm	Surface roughness > 2 µm severely impedes contact AFM tracking
Polished Crystals / Ceramics	Optically polished slice, Ra < 10 nm	Mounted on conductive magnetic disc	Bottom conductive layer for electrical ground path

Testing Function

Piezoresponse Force Microscopy (PFM) utilizes conductive AFM cantilever tips to apply localized AC and DC electric fields to ferroelectric and piezoelectric surfaces, detecting sub-nanometer converse piezoelectric deformations via lock-in amplification. Conducted on our premier Oxford Asylum Research VERO ES platform, this service delivers high-resolution domain orientation maps, nanoscopic domain writing, and localized d33* butterfly switching loops.

Testing Conditions

Primary Instruments: Oxford Instruments Asylum Research VERO ES
Standard Turnaround: Within 5 working days
Key Standards: ISO/TS 19807-1 Nanotechnologies - Magnetic and Piezoresponse Force Microscopy

Sample Requirements

Please review the detailed specimen dimensions, electrode requirements, and poling conditions in the table above. Custom dimensions and special sample geometry can be accommodated upon technical consultation.

Testing Standards

ISO/TS 19807-1 Nanotechnologies - Magnetic and Piezoresponse Force Microscopy

Test Results

Clients receive comprehensive test reports with raw exported ASCII/txt data files, high-resolution curve plots (temperature spectra, impedance plots, or hysteresis loops), and experimental condition parameters stamped by our CMA accredited testing center.

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