High-Temperature Dielectric Spectroscopy (RT to 1150°C)
Technical Specifications & Test Capabilities
| Parameter / Metric | Specification Range & Accuracy | Operational Notes |
|---|---|---|
| Temperature Range | Room Temperature to 1000°C / 1650°C | Programmable ramp rates with multi-step dwell |
| Frequency Coverage | 100 Hz to 1 MHz / 5 MHz / 10 MHz / 20 MHz / 30 MHz | Broadband multi-frequency sweeps |
| Measurement Parameters | Cp, Cs, D (tan δ), εr', εr'', Z', Z'' | Automated Nyquist and Cole-Cole extraction |
| Measurement Accuracy | Dielectric loss resolution down to 10⁻⁴ | Shielded four-terminal pair measurement |
Specimen Geometry & Preparation Guide
| Material Form | Recommended Dimensions | Dimensional Limits | Electrode & Poling Notes |
|---|---|---|---|
| Bulk Ceramics & Substrates | Diameter 15–20 mm, thickness 1–2 mm | Thickness < 3 mm, max 2D dimension < 35 mm | Both faces coated with high-temp fired silver or sputtered Pt |
| Unfinished Materials | Bare polished pellet (weight > 2 g) | Thickness < 5 mm | MatMeas provides laboratory electrode coating services upon request |
Testing Function
High-temperature dielectric testing is critical for validating environmental reliability, phase transition kinetics, and thermal performance degradation in functional materials. Operating from room temperature up to 1000°C or 1650°C, our testing system acquires dielectric temperature spectra (ε-T) and impedance frequency spectra (Z-f) across broad frequencies (100 Hz to 30 MHz). This service reliably extracts Curie temperatures (Tc), dipole relaxation behaviors, defect conduction mechanisms, and complex impedance Nyquist and Cole-Cole arcs for electronic ceramics, microwave substrates, and structural oxides.
Testing Conditions
Primary Instruments: HTS-1000, DMS-1650, DMS-1000
Standard Turnaround: Within 5 working days
Key Standards: GB/T 11310-1989 Test Methods for Relative Free Permittivity Temperature Characteristics of Piezoelectric Ceramics; GB/T 31838.6-2021 Solid Insulating Materials Dielectric and Resistive Properties (AC Methods); ASTM D150 Standard Test Methods for AC Loss Characteristics and Permittivity of Solid Electrical Insulation; IEC 60250 Recommended Methods for the Determination of the Permittivity and Dielectric Dissipation Factor
Sample Requirements
Please review the detailed specimen dimensions, electrode requirements, and poling conditions in the table above. Custom dimensions and special sample geometry can be accommodated upon technical consultation.
Testing Standards
- GB/T 11310-1989 Test Methods for Relative Free Permittivity Temperature Characteristics of Piezoelectric Ceramics
- GB/T 31838.6-2021 Solid Insulating Materials Dielectric and Resistive Properties (AC Methods)
- ASTM D150 Standard Test Methods for AC Loss Characteristics and Permittivity of Solid Electrical Insulation
- IEC 60250 Recommended Methods for the Determination of the Permittivity and Dielectric Dissipation Factor
Test Results
Clients receive comprehensive test reports with raw exported ASCII/txt data files, high-resolution curve plots (temperature spectra, impedance plots, or hysteresis loops), and experimental condition parameters stamped by our CMA accredited testing center.
Turnkey Equipment for Your Own Laboratory
Prefer in-house characterization? Every test in our laboratory is performed using MatMeas turnkey instruments. Verify measurement quality with sample testing before capital procurement.
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