MatMeas High Precision In‑situ d33 Piezoelectric Measurement System – PEMS Analyzer — 1

Overview

The MatMeas PEMS precision in‑situ d33 measurement system is designed for advanced characterization of piezoelectric materials. The system integrates dynamic direct traceability technology and AC resonance vibration evaluation to measure piezoelectric parameters with higher accuracy and reliability than traditional quasi‑static d33 meters. It supports measurement of multiple sample shapes such as discs, rings, tubes, blocks and strips, making it suitable for research institutes, material laboratories and industrial piezoelectric component production.

Specifications

Force Frequency30 Hz – 300 Hz
Default Frequency110 Hz
Frequency Accuracy0.1 Hz
FAST Mode2 s to 1% of final reading
MEDIUM Mode5 s to 1% of final reading
SLOW Mode10 s to 1% of final reading
Communication InterfaceRS232, USB
Power Supply220–240V AC 50–60Hz 0.5A
Alternative Power100–120V AC 50–60Hz 1A
Storage Temperature0°C – 50°C
Operating Temperature10°C – 40°C
Calibration Temperature25°C
Instrument Size600 × 540 × 1530 mm
Measurement Unit Size350 × 250 × 100 mm
Force Unit Size145 × 150 × 175 mm

Applications

  1. Piezoelectric ceramic research
  2. sensor and actuator development
  3. aerospace and high-reliability materials testing
  4. semiconductor laboratories
  5. advanced materials research institutes
  6. industrial quality inspection of piezoelectric components.

More Details

  1. PEMS Piezoelectric Analyzer Features
    Supports measurement of d33, d31 and d15 coefficients. Measures equivalent circuit parameters including C1, L1, R1 and C0 and resonance frequencies fs, fp, fm, fn, fa and fr. Dynamic force measurement enables analysis of d33 variation under different preload conditions
  2. PEMS Piezoelectric Analyzer Specifications
    measurement frequency 30–300 Hz, default 110 Hz, communication interfaces RS232 and USB, measurement accuracy high precision with repeatable results for laboratory and industrial environments.

FAQ

  • Why do standard Berlincourt meters fail to predict real-world piezoelectric sensor performance?

    Standard d33 meters only measure the piezoelectric coefficient at room temperature under static conditions, completely ignoring the fact that real-world sensors operate under thermal and mechanical stress. The MatMeas PEMS-1000 is a high-precision in-situ measurement system that characterizes the dynamic d33 response under varying temperatures and applied forces, providing true operational data.
  • How does the PEMS-1000 isolate pure piezoelectric signals from massive thermal noise?

    When heating piezoelectric materials, massive pyroelectric currents and thermal noise often drown out the minute d33 signal. The PEMS-1000 utilizes a proprietary lock-in amplification architecture and heavily shielded fixtures to mathematically extract the pure piezoelectric charge, ensuring pristine data integrity even under extreme environmental conditions.
  • What is the primary measurement principle of the PEMS-1000?

    The PEMS-1000 uses dynamic force direct traceability technology and AC resonance vibration evaluation to measure the d33 piezoelectric coefficient in-situ. Unlike traditional quasi-static d33 meters, the PEMS-1000 provides higher accuracy and stability by avoiding static force drift and offering dynamic frequency sweep capabilities from 30 Hz to 300 Hz.
  • Which sample shapes and geometries can be measured with the PEMS-1000?

    The system is highly adaptable and supports a wide variety of sample shapes including discs, rings, tubes, blocks, and thin strips. It comes with specialized clamping fixtures to ensure reliable contact and uniform force application without damaging fragile samples.
  • What other piezoelectric parameters can the PEMS-1000 characterize besides the d33 coefficient?

    In addition to the d33 coefficient, the system can characterize other coefficients such as d31 and d15. It also measures equivalent circuit parameters (C1, L1, R1, C0) and key resonance frequencies (fs, fp, fm, fn, fa, fr) to provide a comprehensive piezoelectric performance profile.