Overview
Matmeas DMS1650 Ultra-High Temperature Dielectric Impedance Spectrometer is an integrated system specifically developed for studying the electrical properties of dielectric materials under ultra-high temperature conditions.
The instrument combines a high-temperature furnace, precision measurement fixture, advanced control software, and an integrated display system into a compact platform. Based on the parallel-plate capacitor measurement principle, the system enables accurate characterization of dielectric constant, dielectric loss, and impedance spectroscopy over a wide temperature and frequency range.
The system supports testing under ambient atmosphere, high-temperature conditions, vacuum environments, and controlled gas atmospheres, allowing researchers to investigate the dielectric behavior of materials as a function of temperature, frequency, and time.
With its stable temperature control system and integrated design, the DMS1650 provides reliable and repeatable dielectric measurements for ceramic materials, electronic components, and advanced functional materials. It is widely used in universities, research institutes, and industrial laboratories for dielectric material research and development.
Specifications
| Parameter | Specification |
| Temperature Range | Room Temperature ~ 1600°C |
| Temperature Control Accuracy | ±3°C |
| Temperature Control Method | PID Precision Control |
| Heating Rate | 0–10°C/min (Typical 3°C/min) |
| Frequency Range | ~20 Hz – 1 MHz |
| Measurement Accuracy | Dependent on the specifications of the connected impedance analyzer. |
| Measurement Principle | Parallel Plate Capacitor Method |
| Measurement Channel | Single Channel |
| Sample Size | Diameter < 20 mm, Thickness < 5 mm |
| Electrode Material | Platinum Electrodes (Top and Bottom) |
| Measurement Environment | Flowing Gas Atmosphere |
| Operating Temperature | 5 °C – 40 °C |
| Power Supply | 220 V / 60 Hz ~ 4800 W |
| Dimensions | 1260 x 760 x 1727mm(LxWxH) |
| Weight | 200kgs |
| Warranty | 1 Year |
Applications
- Dielectric
Ceramic Materials Characterization of dielectric properties of ferroelectric ceramics, piezoelectric ceramics, and microwave dielectric materials. - Electronic
Component Materials Evaluation of dielectric performance in capacitors, insulating materials, and electronic substrates. - Functional
Oxide Materials Study of dielectric response of perovskite materials and advanced oxide ceramics at elevated temperatures. - Energy Storage
Materials Investigation of dielectric behavior in high-temperature energy storage ceramics and dielectric capacitor materials. - Academic Research
Widely used in universities and research institutes for advanced dielectric materials research.
FAQ
What is the primary measurement principle of the DMS-1650?
The DMS-1650 is designed using the parallel-plate capacitor method to measure the dielectric properties (dielectric constant, dielectric loss) and impedance spectroscopy of materials under ultra-high temperatures (up to 1600°C) with high precision, eliminating lead resistance and stray capacitance.What sample shapes and sizes are supported?
The system supports standard circular thin-sheet disc samples, typically with a diameter of less than 20 mm and a thickness of less than 5 mm, fitted between the platinum electrodes.Does the DMS-1650 comply with international laboratory standards?
Yes, all measurements fully align with international norms such as ASTM, IEEE, and GB/T standards to deliver publishable, research-grade data.
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